Epitaxial Thin Films, Surfaces

Oral Contributions

1. X-Ray Diffraction Analysis of Free Standing and Overgrown Surface Nanostructures
   U. Pietsch, N. Darowski, K.H. Wang, A. Forchel, Q. Shen, S. Kycia

2. Strain Relaxation in Surface and Buried III-V Multilayer Gratings Studied by High-Resolution XRD and Elasticity Theory
   T. Baumbach, D. Luebbert, L. Leprince, J. Schneck, A. Talneau, R. Felici, A. Mazuelas

3. Grazing Incidence X-Ray Diffraction from Semiconductor Quantum Wires
   A. Ulyanenkov, N. Darowski, U. Pietsch, T. Baumbach, K.H. Wang, A. Forchel

4. Adsorption of Carbon on Ni{100} Studied by Scanned-Energy Mode Photoelectron Diffraction
   R. Terborg, J.T. Hoeft, R. Lindsay, O. Schaff, M. Polcik, A.M. Bradshaw, R. Toomes, N.A. Booth, D.P. Woodruft, J. Denlinger, E. Rotenberg

5. Dependence of defect Structure of Semiconductor Thin Layers on Pressure Annealing
   J. Bak-Misiuk, J. Adamczewska, J. Domagala, Z.R. Zytkiewicz, A. Misiuk, H.B. Surma

Posters

1. The Determination of Two Materials Interface Course Using X-ray Diffraction
   M. Mala

2. Detection of Interlayer Charge Transfer in Crystals from Atomic Positional Parameters
   S. Sh. Shilstein

3. Structural Characterization of ZnSe/GaAs Interface
   A. Ulyanenkov, K. Ishida, M. Kuribayashi, A. Takase

4. X-ray Reflectivity and AFM Study of Thin Layers of Copper Phtalocyanine
   P. Poloucek, V. Holy, F. Lopour, A. Fejfar

5. Disorientation Effects at Epitaxy in Aqueous Media
   A. Glikin, J. Plotkina

6. SO₂ - Induced Surface Reconstruction of Cu{111} Studied by X-Ray-Absorption Fine-Structure
   M. Polcik, L. Wilde, J. Haase

7. Analysis of Strain Relaxation in Free Standing and Buried SQW-Lateral Structures
   N. Darowski, U. Pietsch, K.H. Wang, A. Forchel, S. Kycia, Q. Shen

8. Grazing Incidence Small Angle X-ray Scattering Study of Irradiation Induced defects in Silicon
   P. Dubcek, B. Pivac, S. Bernstorff, H. Amenitsch, R. Tonini, F. Corni, G. Ottaviani

9. Structure Disturbances of Ion Implanted Silicon Crystals
   Z. Swiatek, J. Bonarski, M. Michalec, I. Fodchuk, E. Beltowska-Lehman, R. Ciach

10. Reciprocal space mapping of semiconductor structures-experiment and simulation
    Z. Sourek, J. Kub

11. Determination of miscut angles for crystalline substrates
    S. Harkema

12. Heteroepitaxial Growth of Zirconia Films Obtained by Wet Chemical Route
    R. Guinebretiere, A. Dauger, C. Mary, C. Delage, B. Soulestin

13. High resolution x-ray diffraction investigations of quasi-homoepitaxial 3C-SiC thin films on bH-SiC substrate crystals.
    J. Krausslich, B. Kocher, A. Bauer, K. Goetz, A. Fissel, W. Richter

14. "Unusual" Azimuthal Orientation Relationship in the Heteroepitaxial System "Gallium Nitride on Spinel"
    A. Efimov, A. Lebedev

15. Bicrystallography of the Epitaxial Systems "III-V" Nitrides on Sapphire": Theory and Experiment
    A.N. Efimov, A.O. Lebedev, A.M. Tsaregorodtsev