Thin Films, Multilayers

Oral Contributions

1. How Essential will X-Ray Methods Be for the Future of Semiconductor Technology
   H. Goebel

2. Experiments with Resonantly Enhancing Standing Waves in Thin Film Systems
   S. Di Fonzo, W. Jark, G. Soullie, A. cedola, S. Lagomarsino, P. Cloetens, A. Freund, C. Riekel

3. Structural Characterization of Multilayered Nanostructures by X-Ray Diffraction and Scanning Probe Microscopy
   K. Temst, M.J. Van Bael, V.V. Moshchalkov, C. Van Haesendonck, Y. Bruynseraede

4. Stress, Strain and Interdiffusion in Au/Ni Epitaxied Multilayers
   B. Gilles

5. Local Ordering in Multilayers as Seen by X-Ray Diffraction
   D. Rafaja, J. Vacinova, J. Lhotka

6. Dependence of the X-Ray Elastic Constants on the Diffraction Plane for Polycrystalline Cubic, Hexagonal and Tetragonal Thin Films with Any Fiber Axis
   H. Wern

7. Automated Crystal Orientation Mapping (ACOM) - A New Perspective on the Characterization of Microstructure
   R.A. Schwarzer

Posters

1. The Application of X-Ray Diffraction to Textured Polycrystalline Thin Films: Lead Scandium Tantalate Deposited on Platinised Silicon Substrates
   P.P. Donohue, J.C. Jones, M.A.C. Harper, M.A. Todd

2. Investigation Nature of Thin Films Formation of Pb-MeF2 by X-Ray Diffraction
   I.A. Souchkov

3. The Microstructure of Surface Coatings Applied by Various Techniques on Steel Substrates
   I. Iordanova, K.S. Forcey, M. Surtchev

4. Crystallization Behaviour of Al-W Amorphous Thin Films
   N. Radic, A. Tonejc, A.M. Tonejc, J. Ivkov, T. Car

5. Multilayer Optics for Soft X-Rays
   H. Grimmer, M. Horisberger, U. Staub, H.-Ch. Mertins, F. Schäfers

6. Microstructural Studies of Co/Cu(111) Multilayers
   Karimat El-Sayed, A. Soliman

7. Comparison of Interface Quality in Evaporated and Sputtered Mo/Si Multilayers for X-UV Optics
   M. Jergel,V. Holy, E. Majkova, S. Luby, R. Senderak, H.J. Stock, D. Menke, U. Kleinberg, U. Heinzmann

8. Study of Influence of Hydrigen on Structure of Multilayer Thin Films Pd/Fe
   M.V. Starkova, A.A. Katsnelson, E.V. Lichushina, S.V. Sveshnikov

9. Nonspecular X-Ray Reflection from Selforganized Interfaces in a SiGe/Si Multilayer
   J. Grim, V. Holy, J. Kubena, J. Stangl, A.A. Darhuber, S. Zerlauth, F. Schäffler, G. Bauer

10. Characterisation of the Quality of Sputtered and PCVD Metal/Si Multilayers
    M. Löhmann, J. Bläsing, F. Klabunde, T.P. Drüsedau

11. Characterisation of real structure of ultra-thin magnetic multilayers using X-ray reflectivity, X-ray diffraction and DAFS methods
    J. Vacinova, D. Rafaja, V. Valvoda

12. High-Resolution X-Ray Diffraction Investigation of the Strains in GaInAs/GaAs Multilayer Nanostructures
    V.P. Mrktchyan, A.P. Aivazyan, V.S. Harutyunyan

13. Structural Characterization of Sol-Gel-Derived Silica Films by Infrared Spectroscopy and Glancing Angle X-Ray Diffraction
    Y. Matsumoto, F. Nishi