A8 - Surfaces, Thin Layers, Epitaxial Thin Films
Chair: Vaclav Holy (Czech Republic), Co-chair: Matej Jergel (Slovakia)
15.45 | U. Pietsch, N. Darowski, K.H. Wang, A. Forchel, Q. Shen, S. Kycia | X-Ray Diffraction Analysis of Free Standing and Overgrown Surface Nanostructures | A |
16.25 | T. Baumbach, D. Luebbert, L. Leprince, J. Schneck, A. Talneau, R. Felici, A. Mazuelas | Strain Relaxation in Surface and Buried III-V Multilayer Gratings Studied by High-Resolution XRD and Elasticity Theory | A |
16.45 | Break |
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17.10 | A. Ulyanenkov, N. Darowski, U. Pietsch, T. Baumbach, K.H. Wang, A. Forchel | Grazing Incidence X-Ray Diffraction from Semiconductor Quantum Wires | A |
17.30 | R. Terborg, J.T. Hoeft, R. Lindsay, O. Schaff, M. Polcik, A.M. Bradshaw, R. Toomes, N.A. Booth, D.P. Woodruft, J. Denlinger, E. Rotenberg | Adsorption of Carbon on Ni{100} Studied by Scanned-Energy Mode Photoelectron Diffraction | A |
17.50 | J. Bak-Misiuk, J. Adamczewska, J. Domagala, Z.R. Zytkiewicz, A. Misiuk, H.B. Surma | Dependence of Defect Structure of Semiconductor Thin Layers on Pressure Annealing | A |
18.10 |