A7 - Thin Film and Multilayers
Chair: H Goebel (Germany), Co-chair: Vaclav Valvoda (Czech Republic)
10.00 | H. Goebel | How Essential will X-Ray Methods Be for the Future of Semiconductor Technology | A |
10.20 | S. Di Fonzo | Experiments with Resonantly Enhancing Standing Waves in Thin Film Systems | A |
10.40 | K. Temst, M.J. Van Bael, V.V. Moshchalkov, C. Van Haesendonck, Y. Bruynseraede | Structural Characterization of Multilayered Nanostructures by X-Ray Diffraction and Scanning Probe Microscopy | A |
11.00 | Break |
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11.30 | B. Gilles | Stress, Strain and Interdiffusion in Au/Ni Epitaxied Multilayers | A |
11.50 | D. Rafaja | Local Ordering in Multilayers as Seen by X-Ray Diffraction | A |
12.10 | H. Wern | Dependence of the X-Ray Elastic Constants on the Diffraction Plane for Polycrystalline Cubic, Hexagonal and Tetragonal Thin Films with Any Fiber Axis | A |
12.30 | R. Schwarzer | Automated Crystal Orientation Mapping (ACOM) - A New Perspective on the Characterization of Microstructure | A |