Epitaxial Thin Films, Surfaces
Oral Contributions
X-Ray Diffraction Analysis of Free Standing and Overgrown Surface Nanostructures
U. Pietsch, N. Darowski, K.H. Wang, A. Forchel, Q. Shen, S. Kycia
Strain Relaxation in Surface and Buried III-V Multilayer Gratings Studied by High-Resolution XRD and Elasticity Theory
T. Baumbach, D. Luebbert, L. Leprince, J. Schneck, A. Talneau, R. Felici, A. Mazuelas
Grazing Incidence X-Ray Diffraction from Semiconductor Quantum Wires
A. Ulyanenkov, N. Darowski, U. Pietsch, T. Baumbach, K.H. Wang, A. Forchel
Adsorption of Carbon on Ni{100} Studied by Scanned-Energy Mode Photoelectron Diffraction
R. Terborg, J.T. Hoeft, R. Lindsay, O. Schaff, M. Polcik, A.M. Bradshaw, R. Toomes, N.A. Booth, D.P. Woodruft, J. Denlinger, E. Rotenberg
Dependence of defect Structure of Semiconductor Thin Layers on Pressure Annealing
J. Bak-Misiuk, J. Adamczewska, J. Domagala, Z.R. Zytkiewicz, A. Misiuk, H.B. Surma
Posters
The Determination of Two Materials Interface Course Using X-ray Diffraction
M. Mala
Detection of Interlayer Charge Transfer in Crystals from Atomic Positional Parameters
S. Sh. Shilstein
Structural Characterization of ZnSe/GaAs Interface
A. Ulyanenkov, K. Ishida, M. Kuribayashi, A. Takase
X-ray Reflectivity and AFM Study of Thin Layers of Copper Phtalocyanine
P. Poloucek, V. Holy, F. Lopour, A. Fejfar
Disorientation Effects at Epitaxy in Aqueous Media
A. Glikin, J. Plotkina
SO
2
- Induced Surface Reconstruction of Cu{111} Studied by X-Ray-Absorption Fine-Structure
M. Polcik, L. Wilde, J. Haase
Analysis of Strain Relaxation in Free Standing and Buried SQW-Lateral Structures
N. Darowski, U. Pietsch, K.H. Wang, A. Forchel, S. Kycia, Q. Shen
Grazing Incidence Small Angle X-ray Scattering Study of Irradiation Induced defects in Silicon
P. Dubcek, B. Pivac, S. Bernstorff, H. Amenitsch, R. Tonini, F. Corni, G. Ottaviani
Structure Disturbances of Ion Implanted Silicon Crystals
Z. Swiatek, J. Bonarski, M. Michalec, I. Fodchuk, E. Beltowska-Lehman, R. Ciach
Reciprocal space mapping of semiconductor structures-experiment and simulation
Z. Sourek, J. Kub
Determination of miscut angles for crystalline substrates
S. Harkema
Heteroepitaxial Growth of Zirconia Films Obtained by Wet Chemical Route
R. Guinebretiere, A. Dauger, C. Mary, C. Delage, B. Soulestin
High resolution x-ray diffraction investigations of quasi-homoepitaxial 3C-SiC thin films on bH-SiC substrate crystals.
J. Krausslich, B. Kocher, A. Bauer, K. Goetz, A. Fissel, W. Richter
"Unusual" Azimuthal Orientation Relationship in the Heteroepitaxial System "Gallium Nitride on Spinel"
A. Efimov, A. Lebedev
Bicrystallography of the Epitaxial Systems "III-V" Nitrides on Sapphire": Theory and Experiment
A.N. Efimov, A.O. Lebedev, A.M. Tsaregorodtsev