Thin Films, Multilayers
Oral Contributions
How Essential will X-Ray Methods Be for the Future of Semiconductor Technology
H. Goebel
Experiments with Resonantly Enhancing Standing Waves in Thin Film Systems
S. Di Fonzo, W. Jark, G. Soullie, A. cedola, S. Lagomarsino, P. Cloetens, A. Freund, C. Riekel
Structural Characterization of Multilayered Nanostructures by X-Ray Diffraction and Scanning Probe Microscopy
K. Temst, M.J. Van Bael, V.V. Moshchalkov, C. Van Haesendonck, Y. Bruynseraede
Stress, Strain and Interdiffusion in Au/Ni Epitaxied Multilayers
B. Gilles
Local Ordering in Multilayers as Seen by X-Ray Diffraction
D. Rafaja, J. Vacinova, J. Lhotka
Dependence of the X-Ray Elastic Constants on the Diffraction Plane for Polycrystalline Cubic, Hexagonal and Tetragonal Thin Films with Any Fiber Axis
H. Wern
Automated Crystal Orientation Mapping (ACOM) - A New Perspective on the Characterization of Microstructure
R.A. Schwarzer
Posters
The Application of X-Ray Diffraction to Textured Polycrystalline Thin Films: Lead Scandium Tantalate Deposited on Platinised Silicon Substrates
P.P. Donohue, J.C. Jones, M.A.C. Harper, M.A. Todd
Investigation Nature of Thin Films Formation of Pb-MeF2 by X-Ray Diffraction
I.A. Souchkov
The Microstructure of Surface Coatings Applied by Various Techniques on Steel Substrates
I. Iordanova, K.S. Forcey, M. Surtchev
Crystallization Behaviour of Al-W Amorphous Thin Films
N. Radic, A. Tonejc, A.M. Tonejc, J. Ivkov, T. Car
Multilayer Optics for Soft X-Rays
H. Grimmer, M. Horisberger, U. Staub, H.-Ch. Mertins, F. Schäfers
Microstructural Studies of Co/Cu(111) Multilayers
Karimat El-Sayed, A. Soliman
Comparison of Interface Quality in Evaporated and Sputtered Mo/Si Multilayers for X-UV Optics
M. Jergel,V. Holy, E. Majkova, S. Luby, R. Senderak, H.J. Stock, D. Menke, U. Kleinberg, U. Heinzmann
Study of Influence of Hydrigen on Structure of Multilayer Thin Films Pd/Fe
M.V. Starkova, A.A. Katsnelson, E.V. Lichushina, S.V. Sveshnikov
Nonspecular X-Ray Reflection from Selforganized Interfaces in a SiGe/Si Multilayer
J. Grim, V. Holy, J. Kubena, J. Stangl, A.A. Darhuber, S. Zerlauth, F. Schäffler, G. Bauer
Characterisation of the Quality of Sputtered and PCVD Metal/Si Multilayers
M. Löhmann, J. Bläsing, F. Klabunde, T.P. Drüsedau
Characterisation of real structure of ultra-thin magnetic multilayers using X-ray reflectivity, X-ray diffraction and DAFS methods
J. Vacinova, D. Rafaja, V. Valvoda
High-Resolution X-Ray Diffraction Investigation of the Strains in GaInAs/GaAs Multilayer Nanostructures
V.P. Mrktchyan, A.P. Aivazyan, V.S. Harutyunyan
Structural Characterization of Sol-Gel-Derived Silica Films by Infrared Spectroscopy and Glancing Angle X-Ray Diffraction
Y. Matsumoto, F. Nishi