X-RAY ANALYSIS OF MICROTEXTURE DEVELOPMENT IN ALUMINIUM AND COPPER DURING HOT COMPRESSION

M. Haberjahn, P. Klimanek, M. Motylenko

Freiberg University of Mining and Technology, Institute of Physical Metallurgy, Gustav Zeuner Str. 5, D-09596 Freiberg, Germany

Plastic deformation of metallic materials on multislip conditions leads frequently to the formation of dislocation cell structures accompanied by considerable misorientations between adjacent cell walls or subboundaries, respectively. These dislocation cell structure is reflected by the microtexture which describes the population of individual orientations [1]. But while the development of the dislocation content has been studied relatively often, investigations concerning the formation of the microtexture are rare.

The present contribution informs about investigations of [001]-orientated Al and Cu single crystals deformed in the ranges e<= 0.7 (Al) and e<= 0.3 (Cu) by compression at 0.64 Tm with different compression rates

In order to get knowledge of the dislocation content, described by the dislocation density and dislocation correlation and the mean cell size and disorientation, the microtexture development was studied by means of x-ray analysis of the azimuthal and radial intensity distribution and additionally by the EBSP-technique.

The EBSP-technique delivers the local orientation of each subgrain and therefore the results of EBSP [2] were compared to the azimuthal intensity distribution which reflects an integral cell disorientation.

Corresponding to theoretical predictions [3, 4] the rotational fields due to the dislocation walls cause a large broadening of the intensity distribution in the azimuthal direction with increasing deformation. The kinematical approach of the above cited papers make it possible to calculate the mean disorientation angle by comparing the theoretical azimuthal intensity distribution with the experimentelly measured distribution.

  1. Randle, V., Microtexture Determination and its Applications, The Institute of Materials, London, 1992
  2. Trötzschel, J., Pantleon, W., Haberjahn, M., Klimanek, P., Mat. Sci. Eng. A 234-236 (1997) 842
  3. Krivoglaz, M.A., X-ray and Neutron Diffraction in Nonideal Crystals, Springer-Verlag, Berlin, Heidelberg, 1996
  4. Barabash, R. I., Klimanek, P., to be published in J. Appl. Cryst.